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Automatic test pattern generation
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51	/tardir/tiffs/a383695.tiff Add to Reading List Source URL: edocs.nps.edu Language: English - Date: 2004-06-17 14:56:21 Survival analysis Design for X Reliability engineering Systems science Engineering Test plan Software Reliability Testing Automatic test pattern generation Software testing Systems engineering Failure
52	Horseshoes, Hand Grenades, and Timing Signoff: When Getting Close is ‘Good Enough’ Arvind NV, Krishna Panda, Anthony Hill Texas Instruments Inc. March 2014 Add to Reading List Source URL: tauworkshop.com Language: English - Date: 2014-04-28 21:48:14 Signoff Dynamic voltage scaling Uncertainty Automatic test pattern generation Process corners Electronics Electronic engineering Statistics Electronic design automation
53	An Ecomonical Alternative to Boundary Scan in Memory Devices Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-01-22 18:19:36 Manufacturing Boundary scan Design for testing Joint Test Action Group In-circuit test Automatic test pattern generation Integrated circuit design Input/output Reliability engineering Electronics manufacturing Electronic engineering Electronics
54	PDF Document Add to Reading List Source URL: www.pld.ttu.ee Language: English - Date: 1999-04-05 05:37:43 Model checking Automatic test pattern generation Mathematics Design Binary decision diagram Boolean algebra Diagrams
55	PDF Document Add to Reading List Source URL: users.ecs.soton.ac.uk Language: English - Date: 2006-10-12 05:47:40 Electronics Electronic design Fault model Fault Automatic test pattern generation Single stuck line Electronic engineering Digital electronics Geology

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